All "unknown xy SPI chip" entries claim to have status UNTESTED for probe/read/erase/write. That is incorrect.
A bit of confusion comes from how the #defines are named. We call them TEST_BAD_*, but the message printed by flashrom says: "This flash part has status NOT WORKING for operations:"
Something that is unimplemented is definitely not working.
Neither of the chip entries mentioned above has erase or write functions implemented, so erase and write are not working. Since their size is unknown, we can't read them in. That means read is not working as well. Probing is a different matter. If a chip-specific probe function had matched, we wouldn't have to handle the chip with the "unknown xy SPI chip" fallback. I'm tempted to call that "not working" as well, but I'm open to discussion on this point.
Signed-off-by: Carl-Daniel Hailfinger c-d.hailfinger.devel.2006@gmx.net
Index: flashrom-test_bad/flashchips.c =================================================================== --- flashrom-test_bad/flashchips.c (Revision 4162) +++ flashrom-test_bad/flashchips.c (Arbeitskopie) @@ -2167,7 +2167,7 @@ .model_id = GENERIC_DEVICE_ID, .total_size = 0, .page_size = 256, - .tested = TEST_UNTESTED, + .tested = TEST_BAD_PREW, .probe = probe_spi_rdid, .erase = NULL, .write = NULL, @@ -2180,7 +2180,7 @@ .model_id = GENERIC_DEVICE_ID, .total_size = 0, .page_size = 256, - .tested = TEST_UNTESTED, + .tested = TEST_BAD_PREW, .probe = probe_spi_rdid, .erase = NULL, .write = NULL, @@ -2193,7 +2193,7 @@ .model_id = GENERIC_DEVICE_ID, .total_size = 0, .page_size = 256, - .tested = TEST_UNTESTED, + .tested = TEST_BAD_PREW, .probe = probe_spi_rdid, .erase = NULL, .write = NULL, @@ -2206,7 +2206,7 @@ .model_id = GENERIC_DEVICE_ID, .total_size = 0, .page_size = 256, - .tested = TEST_UNTESTED, + .tested = TEST_BAD_PREW, .probe = probe_spi_rdid, .erase = NULL, .write = NULL, @@ -2219,7 +2219,7 @@ .model_id = GENERIC_DEVICE_ID, .total_size = 0, .page_size = 256, - .tested = TEST_UNTESTED, + .tested = TEST_BAD_PREW, .probe = probe_spi_rdid, .erase = NULL, .write = NULL, @@ -2232,7 +2232,7 @@ .model_id = GENERIC_DEVICE_ID, .total_size = 0, .page_size = 256, - .tested = TEST_UNTESTED, + .tested = TEST_BAD_PREW, .probe = probe_spi_rdid, .erase = NULL, .write = NULL,
Carl-Daniel Hailfinger wrote:
Group each probe function together with the associated IDs in the flash chip description.
Please add a ticket for this in trac to avoid that the patch is forgotten.
Carl-Daniel Hailfinger wrote:
All "unknown xy SPI chip" entries claim to have status UNTESTED for probe/read/erase/write.
I think that's the only test status that makes sense for them.
Something that is unimplemented is definitely not working.
TEST_BAD_ means that the operation has been confirmed to fail. Since these unknown chip entries will match any number of chips never seen by flashrom before I do not think it makes much sense to claim that anything at all has been confirmed.
I'd like to shift focus to how we can take out the unknown chip entries.
What purpose do these entries serve? Is it strictly to inform the user that flashrom was able to communicate with the flash chip but does not yet support the particular model? I think that is a fairly special case, which needs special handling.
//Peter
On Wed, Apr 22, 2009 at 01:43:14AM +0200, Carl-Daniel Hailfinger wrote:
All "unknown xy SPI chip" entries claim to have status UNTESTED for probe/read/erase/write. That is incorrect.
A bit of confusion comes from how the #defines are named. We call them TEST_BAD_*, but the message printed by flashrom says: "This flash part has status NOT WORKING for operations:"
Something that is unimplemented is definitely not working.
Neither of the chip entries mentioned above has erase or write functions implemented, so erase and write are not working. Since their size is unknown, we can't read them in. That means read is not working as well. Probing is a different matter. If a chip-specific probe function had matched, we wouldn't have to handle the chip with the "unknown xy SPI chip" fallback. I'm tempted to call that "not working" as well, but I'm open to discussion on this point.
Signed-off-by: Carl-Daniel Hailfinger c-d.hailfinger.devel.2006@gmx.net
Sounds reasonable.
Acked-by: Uwe Hermann uwe@hermann-uwe.de
Uwe.
On 22.04.2009 14:41, Uwe Hermann wrote:
On Wed, Apr 22, 2009 at 01:43:14AM +0200, Carl-Daniel Hailfinger wrote:
All "unknown xy SPI chip" entries claim to have status UNTESTED for probe/read/erase/write. That is incorrect.
A bit of confusion comes from how the #defines are named. We call them TEST_BAD_*, but the message printed by flashrom says: "This flash part has status NOT WORKING for operations:"
Something that is unimplemented is definitely not working.
Neither of the chip entries mentioned above has erase or write functions implemented, so erase and write are not working. Since their size is unknown, we can't read them in. That means read is not working as well. Probing is a different matter. If a chip-specific probe function had matched, we wouldn't have to handle the chip with the "unknown xy SPI chip" fallback. I'm tempted to call that "not working" as well, but I'm open to discussion on this point.
Signed-off-by: Carl-Daniel Hailfinger c-d.hailfinger.devel.2006@gmx.net
Sounds reasonable.
Acked-by: Uwe Hermann uwe@hermann-uwe.de
Thanks, r4177.
Regards, Carl-Daniel
Uwe Hermann wrote:
Sounds reasonable.
Does it really sound reasonable for flashrom to claim that a chip which can only be matched by a wildcard has a known test status?
//Peter