Carl-Daniel Hailfinger wrote:
Group each probe function together with the associated IDs in the flash chip description.
Please add a ticket for this in trac to avoid that the patch is forgotten.
Carl-Daniel Hailfinger wrote:
All "unknown xy SPI chip" entries claim to have status UNTESTED for probe/read/erase/write.
I think that's the only test status that makes sense for them.
Something that is unimplemented is definitely not working.
TEST_BAD_ means that the operation has been confirmed to fail. Since these unknown chip entries will match any number of chips never seen by flashrom before I do not think it makes much sense to claim that anything at all has been confirmed.
I'd like to shift focus to how we can take out the unknown chip entries.
What purpose do these entries serve? Is it strictly to inform the user that flashrom was able to communicate with the flash chip but does not yet support the particular model? I think that is a fairly special case, which needs special handling.
//Peter