#103: flashrom: Don't exit() after successful erase; enable testing all operations in one invocation ----------------------------------+----------------------------------------- Reporter: stuge | Owner: stuge Type: enhancement | Status: assigned Priority: major | Milestone: flashrom v1.0 Component: flashrom | Version: Keywords: erase exit testing | Dependencies: #117 Patchstatus: patch needs review | ----------------------------------+----------------------------------------- Changes (by stuge):
* keywords: erase exit => erase exit testing * dependencies: => #117 * type: defect => enhancement
Comment:
This allows -Er -Ew and -Ev but they are pretty useless. The point is that this allows -Ewv which will test erase, write and read (both during erase and verify) operations on the probed flash chip, so it's an easy way to exercise flash chip drivers.
Currently the order of commands (-E -r -w -v) on the command line is not significant, if multiple commands are specified flashrom will always execute them in order ERASE READ WRITE VERIFY.
This can be bad for users running -rE expecting to get a backup before the erase is done. A simple solution would be to change the order in main() into READ ERASE WRITE VERIFY, in which case the invocation:
flashrom -rEwv org.bin
will save the original contents, erase the chip and write back the original, verifying each step.