#103: flashrom: Don't exit() after successful erase; enable testing all operations in one invocation ----------------------------------+----------------------------------------- Reporter: stuge | Owner: stuge Type: enhancement | Status: assigned Priority: major | Milestone: flashrom v1.0 Component: flashrom | Version: Keywords: erase exit testing | Dependencies: #117 Patchstatus: patch needs work | ----------------------------------+----------------------------------------- Changes (by stepan):
* patchstatus: patch needs review => patch needs work
Comment:
It also does not necessarily do the same thing with the hardware as calling the single functions. Strictly, a reboot between any of the tests would be the most reliable way of testing flashrom.
Answering Peter's concerns, if we're going to add a method of "simplifying flashrom tests" that is a new feature, and it should get a new option. Using -Erwv for that ignores that fact by adding a lot of implicit assumptions. Implicit assumptions are fatal for any user interface.
Strictly speaking, -wv should be disallowed, too. Instead, write should guarantee that the write succeeded, or print an error otherwise. As should an erase make sure that the chip is erased, if the program exists without error.
Other than that, we should stick with the small utility approach, and have the tool do one thing at a time.