Auf 05.03.2011 23:57, Michael Karcher schrieb:
Hello Carl-Daniel,
Am Samstag, den 05.03.2011, 22:30 +0100 schrieb Carl-Daniel Hailfinger:
If I understand it correctly, the delays in erase_sector_jedec_common are mostly for chips that need commands to be written so slowly - these chips should require a probe delay, too. So would there be a problem to put these delays into a "probe timing not zero" test?
AFAIK the erase delay is used on chips which need the probe delay anyway, so your test would indeed cover those problems. However, there is one exception: Winbond W39V040C. See the mail at http://www.flashrom.org/pipermail/flashrom/2009-December/001330.html We could add a new feature bit for this...
I don't see how that is related, except for also covering some erase problems. My idea was about removing the delays between the command bytes, while that patch slows down the toggle bit detection. I did not intent to change the toggle bit stuff or use the non-slow call. Do I miss something?
Ah OK, misunderstanding on my side. Please go ahead.
Regards, Carl-Daniel