On 23.11.2009 12:20, Maciej Pijanka wrote:
On sun, 22 Nov 2009, Carl-Daniel Hailfinger wrote:
Add the ability to generate test patterns for write testing. This will be useful once we create a --test function for flashrom.
The test patterns make it easy to find skipped and duplicated bytes, are human readable, and the first 8 of them have block numbers to detect aliasing or wraparounds. Current size limit for aliasing detection is 16 MByte, but since neither LPC nor FWH nor SPI chips exist with bigger sizes, this is reasonably safe.
I used previous version of this patch with success, only idea i had (but never posted it yet) was adding way to differ between odd and even 16bytes blocks to make more easier to detect stuck bits or something, but this isn't very important for generic usage. But new version seems to address this issuess to, and code looks fine for me.
Acked-by: Maciej Pijanka email@example.com
Thanks for the review, r770.