[flashrom] [PATCH] Generate a test pattern

[Carl-Daniel Hailfinger]

On 23.11.2009 12:20, Maciej Pijanka wrote:
> On sun, 22 Nov 2009, Carl-Daniel Hailfinger wrote:
>   
>> New version.
>>
>> Add the ability to generate test patterns for write testing. This will
>> be useful once we create a --test function for flashrom.
>>
>> The test patterns make it easy to find skipped and duplicated bytes, are
>> human readable, and the first 8 of them have block numbers to detect
>> aliasing or wraparounds. Current size limit for aliasing detection
>> is 16 MByte, but since neither LPC nor FWH nor SPI chips exist with
>> bigger sizes, this is reasonably safe.
>>     
>
> I used previous version of this patch with success, only idea i had (but never
> posted it yet) was adding way to differ between odd and even 16bytes blocks to
> make more easier to detect stuck bits or something, but this isn't very important
> for generic usage. 
> But new version seems to address this issuess to, and code looks fine for me.
>
> Acked-by: Maciej Pijanka <maciej.pijanka at gmail.com>
>   

Thanks for the review, r770.

Regards,
Carl-Daniel

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