[flashrom] enum test_state value for "depends"

[Stefan Tauner]

On Thu, 08 May 2014 23:26:51 +0200
Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006 at gmx.net> wrote:

> Am 01.05.2014 18:57 schrieb Stefan Tauner:
> > We currently have an
> > enum test_state {
> > 	OK = 0,
> > 	NT = 1,	/* Not tested */
> > 	BAD
> > };
> >
> > This is used in various arrays, namely those for
> > boards, board enables, chipsets, programmers, and rayer_spi (LPT)
> > devices. I'd like to add another state that indicates that support
> > is configuration-dependent. Most infamous use cases would be boards
> > with ME chipsets and ME chipsets. Another example is the atavia VT6421A
> > LPC programmer which works in general, just not all boards due to a not
> > fully understood offset configuration that is board-specific.
> >
> > Names... CONFIG is quite long but obvious to understand, CD for
> > configuration-dependent would suite me too, but I am open to
> > suggestions. What about DEP?
> 
> DEP or RND (given that from flashrom's POV it's essentially random). But
> yes, DEP sounds good. Thanks for introducing that valuable way to convey
> information.
> 
> Ack.

Good, I'll take care of that. There is another, related thing... since
we support ROMs too now, we might think about an N/A state and/or
feature flag for e.g. write/erase operations of ROMs. Sure, we can tag
them with "no" (support), but that creates stinging red boxes in the
wiki and I don't like that. :)
-- 
Kind regards/Mit freundlichen Grüßen, Stefan Tauner