[flashrom] enum test_state value for "depends"

[Carl-Daniel Hailfinger]

Am 01.05.2014 18:57 schrieb Stefan Tauner:
> We currently have an
> enum test_state {
> 	OK = 0,
> 	NT = 1,	/* Not tested */
> 	BAD
> };
>
> This is used in various arrays, namely those for
> boards, board enables, chipsets, programmers, and rayer_spi (LPT)
> devices. I'd like to add another state that indicates that support
> is configuration-dependent. Most infamous use cases would be boards
> with ME chipsets and ME chipsets. Another example is the atavia VT6421A
> LPC programmer which works in general, just not all boards due to a not
> fully understood offset configuration that is board-specific.
>
> Names... CONFIG is quite long but obvious to understand, CD for
> configuration-dependent would suite me too, but I am open to
> suggestions. What about DEP?

DEP or RND (given that from flashrom's POV it's essentially random). But
yes, DEP sounds good. Thanks for introducing that valuable way to convey
information.

Ack.

Regards,
Carl-Daniel

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