[coreboot] [PATCH] flashrom: Group probe function together with associated IDs (and unknown chips)

Peter Stuge peter at stuge.se
Wed Apr 22 08:23:50 CEST 2009

Carl-Daniel Hailfinger wrote:
> Group each probe function together with the associated IDs in the flash
> chip description.

Please add a ticket for this in trac to avoid that the patch is

Carl-Daniel Hailfinger wrote:
> All "unknown xy SPI chip" entries claim to have status UNTESTED for
> probe/read/erase/write.

I think that's the only test status that makes sense for them.

> Something that is unimplemented is definitely not working.

TEST_BAD_ means that the operation has been confirmed to fail. Since
these unknown chip entries will match any number of chips never seen
by flashrom before I do not think it makes much sense to claim that
anything at all has been confirmed.

I'd like to shift focus to how we can take out the unknown chip

What purpose do these entries serve? Is it strictly to inform the
user that flashrom was able to communicate with the flash chip but
does not yet support the particular model? I think that is a fairly
special case, which needs special handling.


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