On 19.02.2010 11:08, Michael Karcher wrote:
http://www.flashrom.org/pipermail/flashrom/2010-February/002318.html
Should we commit single patches for each positive test report we get, or collect them?
Not sure. I think collecting them and committing once a week (or something like that) would help keep the number of patches down.
--- a/flashchips.c +++ b/flashchips.c @@ -3763,7 +3763,7 @@ struct flashchip flashchips[] = { .total_size = 256, .page_size = 128, .feature_bits = FEATURE_LONG_RESET,
.tested = TEST_UNTESTED,
.tested = TEST_OK_PR,
I propose to have people test probe_jedec with full address bits and restricted address bits. If both work, we might as well use the full version (same for all other operations of the chip) and note it somewhere that the upper bits are "don't care". Maybe we'll get to a point where we can run probe_jedec just once per chip size instead of once per size+addressbits+delay combination in flashchips.c which would be an alternative to the current code. Long term goal, feel free to ignore.
Regards, Carl-Daniel