Attention is currently required from: Nico Huber, Angel Pons, Anastasia Klimchuk.

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1 comment:

• File tests/chip_wp.c:

  • Patch Set #7, Line 177:

    /* Check initial mode. */
    	assert_int_equal(0, flashrom_wp_get_mode(&cfg, &mode));
    	assert_int_equal(WP_MODE_DISABLED, mode);
    
    	/* Switch modes in dummyflasher. */
    	assert_int_equal(0, flashrom_wp_set_mode(&cfg, WP_MODE_PERMANENT));
    	assert_int_equal(0, flashrom_wp_write_chip_config(&flash, &cfg));
    	assert_int_equal(0, flashrom_wp_set_mode(&cfg, WP_MODE_POWER_CYCLE));
    	assert_int_equal(0, flashrom_wp_write_chip_config(&flash, &cfg));
    
    	/* Final mode should be "permanent". */
    	assert_int_equal(0, flashrom_wp_read_chip_config(&flash, &cfg));
    	assert_int_equal(0, flashrom_wp_get_mode(&cfg, &mode));
    	assert_int_equal(WP_MODE_PERMANENT, mode);
    

    What I was trying to understand last time: […]

    I think it's both:

    1) You can't reorder the statements without changing some values.

    2) It doesn't just test success of setting a mode, but also reaction of WP implementation to changing from a mode which prohibits mode changes (both "permanent" and "power cycle" are such regardless of the WP pin state).

    I tend to view it as a single test because if you try to make two tests, the smaller one will be a subset of the larger one, so separation seems pointless.

    I've added more comments in the new patchset, is this better?

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