Attention is currently required from: Nikolai Artemiev.

Patch set 3:Code-Review +2

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1 comment:

• File include/flash.h:

  • Patch Set #1, Line 159: #define UNERASED_VALUE(flash)

    The thoughts I had: we have ERASED_VALUE which is one value (for a given chip), but technically uner […]

    https://chromium.googlesource.com/chromiumos/third_party/flashrom/+/refs/heads/master/flashrom.c#1672

    It is used in cros flashrom too because erased spi flash usually always means either 00 or ff depending on that cip feature flag, therefore a unerased would be the inverse of this for the given chip.

    I don't think it matters for it to be here, it seems pretty logical/predictable place for it and avoids test code containing its own world of logic and data too much. I rather tests be strongly coupled to the code they are testing and not have too many of their own artifacts since test code can develop bugs too.

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