opaque_master: Mark Opaque chip as tested for WP

Opaque masters, by design, populate the flashchip structure during
the execution of their probe function. Therefore any opaque master
operation displays a message to the user:
"This flash part has status UNTESTED for operations: WP".

However, for all the other operations (read, write, erase) opaque
masters always mark them as tested. Thus, align WP as marked tested
inline with other opaque chip operations.

BUG=b:258755442
TEST=the following does not display untested message:
1) flashrom -p dummy:size=8388608,emulate=VARIABLE_SIZE
2) flashrom -p internal (on Intel device)

Original-Change-Id: I5ae4cb49eb0abc6ab26cfe2f3359e4e50dd4fd4f
Original-Signed-off-by: Anastasia Klimchuk <aklm@chromium.org>
Original-Reviewed-on: https://review.coreboot.org/c/flashrom/+/69842
Original-Tested-by: build bot (Jenkins) <no-reply@coreboot.org>
Original-Reviewed-by: Edward O'Callaghan <quasisec@chromium.org>
Original-Reviewed-by: Sergii Dmytruk <sergii.dmytruk@3mdeb.com>
Original-Reviewed-by: Felix Singer <felixsinger@posteo.net>

Change-Id: Iaef2026a9e06a823ab481853b520022ba83b1ca1
Signed-off-by: Felix Singer <felixsinger@posteo.net>
---
M dummyflasher.c
M ichspi.c
M nicintel_eeprom.c
3 files changed, 36 insertions(+), 4 deletions(-)