Attention is currently required from: Anastasia Klimchuk.
Peter Marheine would like Anastasia Klimchuk to review this change.
[WIP] tests: Add tests for erasing chip with protected region
Change-Id: Ifd472b623dbbc4d11d6ffee7e5b24e38b1fb562a
Signed-off-by: Anastasia Klimchuk <aklm@flashrom.org>
Signed-off-by: Peter Marheine <pmarheine@chromium.org>
---
M tests/erase_func_algo.c
M tests/tests.c
M tests/tests.h
3 files changed, 309 insertions(+), 2 deletions(-)
git pull ssh://review.coreboot.org:29418/flashrom refs/changes/92/82392/1
diff --git a/tests/erase_func_algo.c b/tests/erase_func_algo.c
index ed9eb04..35f9a16 100644
--- a/tests/erase_func_algo.c
+++ b/tests/erase_func_algo.c
@@ -49,8 +49,8 @@
uint8_t written_buf[MOCK_CHIP_SIZE]; /* Expected content after write. */
struct erase_invoke eraseblocks_expected[MOCK_CHIP_SIZE]; /* Expected order of eraseblocks invocations. */
unsigned int eraseblocks_expected_ind; /* Expected number of eraseblocks invocations. */
- char erase_test_name[20]; /* Test case display name for testing erase operation. */
- char write_test_name[20]; /* Test case display name for testing write operation. */
+ char erase_test_name[40]; /* Test case display name for testing erase operation. */
+ char write_test_name[40]; /* Test case display name for testing write operation. */
};
struct all_state {
@@ -703,6 +703,145 @@
},
};
+
+#define START_PROTECTED_REGION 8
+#define END_PROTECTED_REGION 16
+
+/*
+ * Setup all test cases with protected region.
+ * Protected region is the same for all test cases, between bytes 8 - 15.
+ */
+static struct test_case test_cases_protected_region[] = {
+ {
+ /*
+ * Test case #0
+ *
+ * Initial vs written: all 16 bytes are different.
+ * One layout region for the whole chip.
+ * Chip with eraseblocks 1, 2, 4, 8, 16.
+ */
+ .chip = &chip_1_2_4_8_16,
+ .regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
+ .initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
+ 0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
+ .erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ 0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
+ .eraseblocks_expected = {{0x0, 0x8}},
+ .eraseblocks_expected_ind = 1,
+ .erase_test_name = "Erase protected region test case #0",
+ }, {
+ /*
+ * Test case #1
+ *
+ * Initial vs written: 9 bytes the same, 7 bytes different.
+ * Two layout regions each one 8 bytes, which is 1/2 size of chip.
+ * Chip with eraseblocks 1, 2, 4, 8, 16.
+ */
+ .chip = &chip_1_2_4_8_16,
+ .regions = {{0, MOCK_CHIP_SIZE/2 - 1, "part1"}, {MOCK_CHIP_SIZE/2, MIN_REAL_CHIP_SIZE - 1, "part2"}},
+ .initial_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
+ 0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
+ .erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ 0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
+ .eraseblocks_expected = {{0x0, 0x8}},
+ .eraseblocks_expected_ind = 1,
+ .erase_test_name = "Erase protected region test case #1",
+ }, {
+ /*
+ * Test case #2
+ *
+ * Initial vs written: 6 bytes the same, 4 bytes different, 4 bytes the same, 2 bytes different.
+ * Two layout regions 11 and 5 bytes each.
+ * Chip with eraseblocks 1, 2, 4, 8, 16.
+ */
+ .chip = &chip_1_2_4_8_16,
+ .regions = {{0, 10, "odd1"}, {11, 15, "odd2"}, {MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
+ .initial_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x0, 0xff,
+ 0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
+ .erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ 0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
+ .eraseblocks_expected = {{0x0, 0x8}},
+ .eraseblocks_expected_ind = 1,
+ .erase_test_name = "Erase protected region test case #2",
+ }, {
+ /*
+ * Test case #3
+ *
+ * Initial vs written: all 16 bytes are different.
+ * Layout with unaligned regions 2+4+9+1b which require use of the 1-byte erase block.
+ * Chip with eraseblocks 1, 8, 16.
+ */
+ .chip = &chip_1_8_16,
+ .regions = {{0, 1, "reg2"}, {2, 5, "reg4"}, {6, 14, "reg9"},
+ {15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
+ .initial_buf = {0x4, 0x4, 0x5, 0x5, 0x5, 0x5, 0x6, 0x6,
+ 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x7},
+ .erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x7},
+ .eraseblocks_expected = {
+ {6, 1, TEST_ERASE_INJECTOR_1},
+ {7, 1, TEST_ERASE_INJECTOR_1},
+ {2, 1, TEST_ERASE_INJECTOR_1},
+ {3, 1, TEST_ERASE_INJECTOR_1},
+ {4, 1, TEST_ERASE_INJECTOR_1},
+ {5, 1, TEST_ERASE_INJECTOR_1},
+ {0, 1, TEST_ERASE_INJECTOR_1},
+ {1, 1, TEST_ERASE_INJECTOR_1},
+ },
+ .eraseblocks_expected_ind = 8,
+ .erase_test_name = "Erase protected region test case #3",
+ }, {
+ /*
+ * Test case #4
+ *
+ * Initial vs written: all 16 bytes are different.
+ * Layout with unaligned region 3+13b which require use of the 1-byte erase block.
+ * Chip with eraseblocks 1, 8, 16.
+ */
+ .chip = &chip_1_8_16,
+ .regions = {{0, 2, "reg3"}, {3, MIN_REAL_CHIP_SIZE - 1, "tail"}},
+ .initial_buf = {0x4, 0x4, 0x4, 0x6, 0x6, 0x6, 0x6, 0x6,
+ 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
+ .erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
+ .eraseblocks_expected = {
+ {3, 1, TEST_ERASE_INJECTOR_1},
+ {4, 1, TEST_ERASE_INJECTOR_1},
+ {5, 1, TEST_ERASE_INJECTOR_1},
+ {6, 1, TEST_ERASE_INJECTOR_1},
+ {7, 1, TEST_ERASE_INJECTOR_1},
+ {0, 1, TEST_ERASE_INJECTOR_1},
+ {1, 1, TEST_ERASE_INJECTOR_1},
+ {2, 1, TEST_ERASE_INJECTOR_1},
+ },
+ .eraseblocks_expected_ind = 8,
+ .erase_test_name = "Erase protected region test case #4",
+ }, {
+ /*
+ * Test case #5
+ *
+ * Initial vs written: all 16 bytes are different.
+ * Layout with unaligned region 9+7b.
+ * Chip with eraseblocks 8, 16.
+ */
+ .chip = &chip_8_16,
+ .regions = {{0, 8, "reg9"}, {9, MIN_REAL_CHIP_SIZE - 1, "tail"}},
+ .initial_buf = {0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4,
+ 0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
+ .erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
+ 0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
+ .eraseblocks_expected = {{0x0, 0x8}},
+ .eraseblocks_expected_ind = 1,
+ .erase_test_name = "Erase test case #5",
+ },
+};
+
static int setup(void **state) {
struct test_case *current_test_case = *state;
g_state.current_test_case = current_test_case;
@@ -746,6 +885,29 @@
}
/*
+ * Creates the array of tests for each test case in test_cases_protected_region[].
+ * The caller needs to free the allocated memory.
+ */
+struct CMUnitTest *get_erase_protected_region_algo_tests(size_t *num_tests) {
+ const size_t test_cases_num = ARRAY_SIZE(test_cases_protected_region);
+
+ struct CMUnitTest *all_cases = calloc(test_cases_num, sizeof(struct CMUnitTest));
+ *num_tests = test_cases_num;
+
+ for (size_t i = 0; i < test_cases_num; i++) {
+ all_cases[i] = (struct CMUnitTest) {
+ .name = test_cases_protected_region[i].erase_test_name,
+ .setup_func = setup,
+ .teardown_func = teardown,
+ .initial_state = &test_cases_protected_region[i],
+ .test_func = erase_unwritable_regions_skipflag_on_test_success,
+ };
+ }
+
+ return all_cases;
+}
+
+/*
* This function is invoked for every test case in test_cases[],
* current test case is passed as an argument.
*/
@@ -845,3 +1007,135 @@
assert_int_equal(0, all_write_test_result);
}
+
+static void get_protected_region(const struct flashctx *flash, unsigned int addr, struct flash_region *region)
+{
+ if (addr < 20)
+ printf("Inside test_get_flash_region for addr=0x%x\n", addr);
+
+ if (addr < START_PROTECTED_REGION) {
+ region->name = strdup("not protected");
+ region->start = 0;
+ region->end = START_PROTECTED_REGION;
+ region->read_prot = false;
+ region->write_prot = false;
+ } else if (addr < END_PROTECTED_REGION) {
+ region->name = strdup("protected");
+ region->start = START_PROTECTED_REGION;
+ region->end = END_PROTECTED_REGION;
+ region->read_prot = true;
+ region->write_prot = true;
+ } else {
+ region->name = strdup("tail");
+ region->start = 16;
+ region->end = flashrom_flash_getsize(flash);
+ region->read_prot = false;
+ region->write_prot = false;
+ }
+}
+
+static int block_erase_chip_with_protected_region(struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen)
+{
+ if (blockaddr + blocklen <= MOCK_CHIP_SIZE) {
+ LOG_ERASE_FUNC;
+
+ /* Register eraseblock invocation. */
+ g_state.eraseblocks_actual[g_state.eraseblocks_actual_ind].blocklen
+ = blocklen;
+ g_state.eraseblocks_actual[g_state.eraseblocks_actual_ind].blockaddr
+ = blockaddr;
+ g_state.eraseblocks_actual_ind++;
+ }
+
+ assert_in_range(blockaddr + blocklen, 0, MIN_REAL_CHIP_SIZE);
+
+ // Check we are not trying to erase protected region. This should not happen,
+ // because the logic should handle protected regions and never invoke erasefn
+ // for them. If this happens, means there is a bug in erasure logic, and test fails.
+ //
+ // Note: returning 1 instead of assert, so that the flow goes back to erasure code
+ // to clean up the memory after failed erase. Memory leaks are also tested by unit tests.
+ if ((blockaddr >= START_PROTECTED_REGION && blockaddr < END_PROTECTED_REGION)
+ || (blockaddr + blocklen - 1 >= START_PROTECTED_REGION
+ && blockaddr + blocklen - 1 < END_PROTECTED_REGION))
+ return 1;
+
+ memset(&g_state.buf[blockaddr], ERASE_VALUE, blocklen);
+ return 0;
+}
+
+void erase_unwritable_regions_skipflag_on_test_success(void **state)
+{
+ struct test_case* current_test_case = *state;
+
+ int all_erase_tests_result = 0;
+ struct flashrom_flashctx flashctx = { 0 };
+ const char *param = ""; /* Default values for all params. */
+
+ struct flashrom_layout *layout;
+
+ setup_chip(&flashctx, &layout, param, current_test_case);
+
+ // This test needs special block erase to emulate protected regions.
+ g_test_erase_injector = block_erase_chip_with_protected_region;
+
+ flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, true);
+
+ // We use dummyflasher programmer in tests, but for this test we need to
+ // replace dummyflasher's default get_region fn with test one.
+ // The rest of master struct is fine for this test.
+ // Note dummyflasher registers multiple masters by default, so replace
+ // get_region for each of them.
+ flashctx.mst->spi.get_region = &get_protected_region;
+ flashctx.mst->opaque.get_region = &get_protected_region;
+
+ printf("%s started.\n", current_test_case->erase_test_name);
+ int ret = flashrom_flash_erase(&flashctx);
+ printf("%s returned %d.\n", current_test_case->erase_test_name, ret);
+
+ int chip_erased = !memcmp(g_state.buf, current_test_case->erased_buf, MOCK_CHIP_SIZE);
+
+ int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual,
+ current_test_case->eraseblocks_expected,
+ current_test_case->eraseblocks_expected_ind * sizeof(struct erase_invoke));
+
+ int eraseblocks_invocations = (g_state.eraseblocks_actual_ind ==
+ current_test_case->eraseblocks_expected_ind);
+
+ if (chip_erased)
+ printf("Erased chip memory state for %s is CORRECT\n",
+ current_test_case->erase_test_name);
+ else
+ printf("Erased chip memory state for %s is WRONG\n",
+ current_test_case->erase_test_name);
+
+ if (eraseblocks_in_order)
+ printf("Eraseblocks order of invocation for %s is CORRECT\n",
+ current_test_case->erase_test_name);
+ else
+ printf("Eraseblocks order of invocation for %s is WRONG\n",
+ current_test_case->erase_test_name);
+
+ if (eraseblocks_invocations)
+ printf("Eraseblocks number of invocations for %s is CORRECT\n",
+ current_test_case->erase_test_name);
+ else
+ printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
+ current_test_case->erase_test_name,
+ current_test_case->eraseblocks_expected_ind,
+ g_state.eraseblocks_actual_ind);
+
+ all_erase_tests_result |= ret;
+ all_erase_tests_result |= !chip_erased;
+ all_erase_tests_result |= !eraseblocks_in_order;
+ all_erase_tests_result |= !eraseblocks_invocations;
+
+ teardown_chip(&layout);
+
+ assert_int_equal(0, all_erase_tests_result);
+}
+
+void erase_unwritable_regions_skipflag_off_test_success(void **state)
+{
+// flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, false);
+}
diff --git a/tests/tests.c b/tests/tests.c
index c38a66c..bff24e5 100644
--- a/tests/tests.c
+++ b/tests/tests.c
@@ -509,6 +509,16 @@
ret |= _cmocka_run_group_tests("erase_func_algo.c tests", erase_func_algo_tests, n_erase_tests, NULL, NULL);
free(erase_func_algo_tests);
+ size_t n_erase_protected_region_tests;
+ struct CMUnitTest *erase_protected_region_algo_tests
+ = get_erase_protected_region_algo_tests(&n_erase_protected_region_tests);
+ ret |= _cmocka_run_group_tests("erase_func_algo.c protected region tests",
+ erase_protected_region_algo_tests,
+ n_erase_protected_region_tests,
+ NULL,
+ NULL);
+ free(erase_protected_region_algo_tests);
+
// Write-protect group should run last.
const struct CMUnitTest chip_wp_tests[] = {
cmocka_unit_test(invalid_wp_range_dummyflasher_test_success),
diff --git a/tests/tests.h b/tests/tests.h
index af5f968..7f8fc3c 100644
--- a/tests/tests.h
+++ b/tests/tests.h
@@ -107,7 +107,10 @@
/* erase_func_algo.c */
struct CMUnitTest *get_erase_func_algo_tests(size_t *num_tests);
+struct CMUnitTest *get_erase_protected_region_algo_tests(size_t *num_tests);
void erase_function_algo_test_success(void **state);
void write_function_algo_test_success(void **state);
+void erase_unwritable_regions_skipflag_off_test_success(void **state);
+void erase_unwritable_regions_skipflag_on_test_success(void **state);
#endif /* TESTS_H */
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